IEC 60749-18-2002 半导体器件.机械和气候试验方法.第18部分:电离辐射(总剂量)
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part18:Ionizingradiation(totaldose)
【原文标准名称】:半导体器件.机械和气候试验方法.第18部分:电离辐射(总剂量)
【标准号】:IEC60749-18-2002
【标准状态】:现行
【国别】:国际
【发布日期】:2002-12
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:定义;电气工程;环境试验;集成电路;试验;电子工程;多语种的;半导体器件;破坏试验;电学测量;气候试验;气候;机械试验;辐射效果;电子设备及元件;元部件;半导体;电离辐射
【英文主题词】:Climate;Climatictests;Components;Definitions;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Ionizingradiation;Mechanicaltesting;Militaryequipment;Multilingual;Radiationeffects;Semiconductordevices;Semiconductors;Spacetransport;Testing
【摘要】:ThispartofIEC60749providesatestprocedurefordefiningrequirementsfortestingpackagedsemiconductorintegratedcircuitsanddiscretesemiconductordevicesforionizingradiation(totaldose)effectsfromacobalt-60(Co)gammaraysource.Thisstandardprovidesanacceleratedannealingtestforestimatinglowdoserateionizingradiationeffectsondevices.Thisannealingtestisimportantforlowdoserateorcertainotherapplicationsinwhichdevicesmayexhibitsignificanttime-dependenteffects.Thisstandardaddressesonlysteady-stateirradiations,andisnotapplicabletopulsetypeirradiations.Itisintendedformilitary-andspace-relatedapplications.Thisstandardmayproduceseveredegradationoftheelectricalpropertiesofirradiateddevicesandthusshouldbeconsideredadestructivetest.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:27P.;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.第18部分:电离辐射(总剂量)
【标准号】:IEC60749-18-2002
【标准状态】:现行
【国别】:国际
【发布日期】:2002-12
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:定义;电气工程;环境试验;集成电路;试验;电子工程;多语种的;半导体器件;破坏试验;电学测量;气候试验;气候;机械试验;辐射效果;电子设备及元件;元部件;半导体;电离辐射
【英文主题词】:Climate;Climatictests;Components;Definitions;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Ionizingradiation;Mechanicaltesting;Militaryequipment;Multilingual;Radiationeffects;Semiconductordevices;Semiconductors;Spacetransport;Testing
【摘要】:ThispartofIEC60749providesatestprocedurefordefiningrequirementsfortestingpackagedsemiconductorintegratedcircuitsanddiscretesemiconductordevicesforionizingradiation(totaldose)effectsfromacobalt-60(Co)gammaraysource.Thisstandardprovidesanacceleratedannealingtestforestimatinglowdoserateionizingradiationeffectsondevices.Thisannealingtestisimportantforlowdoserateorcertainotherapplicationsinwhichdevicesmayexhibitsignificanttime-dependenteffects.Thisstandardaddressesonlysteady-stateirradiations,andisnotapplicabletopulsetypeirradiations.Itisintendedformilitary-andspace-relatedapplications.Thisstandardmayproduceseveredegradationoftheelectricalpropertiesofirradiateddevicesandthusshouldbeconsideredadestructivetest.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:27P.;A4
【正文语种】:英语
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